Novosiadly, S.P., T.H. Benko, and I.T. Kogut. “Features of Electrophysical Diagnostics of Schottky Field Transistors Based on GaAs Epitaxial Layers on Silicon Substrates for Microsystem Applications”. Physics and Chemistry of Solid State 20, no. 3 (September 15, 2019): 311–317. Accessed November 21, 2024. https://personnel.pnu.edu.ua/index.php/pcss/article/view/625.