Novosiadly S, Benko T, Kogut I. Features of Electrophysical Diagnostics of Schottky Field Transistors Based on GaAs Epitaxial Layers on Silicon Substrates for Microsystem Applications. Phys.Chem.Sol.State [Internet]. 2019 Sep. 15 [cited 2024 Sep. 28];20(3):311-7. Available from: https://personnel.pnu.edu.ua/index.php/pcss/article/view/625