Concentration and Size Effects in Electrophysical Properties of Thin Films Based on Permalloy and Silver

Authors

  • I. M. Pazukha Sumy State University
  • D. O. Shuliarenko Sumy State University
  • O. V. Pylypenko Sumy State University
  • M. S. Оvrutskyi Sumy State University
  • L. V. Odnodvorets Sumy State University

DOI:

https://doi.org/10.15330/pcss.21.2.238-242

Keywords:

thin-film, electrical resistivity, temperature coefficient of resistance, size effect, concentration effect

Abstract

Complex study of electrophysical properties (the electrical resistivity r and the temperature coefficient of resistance (TCR) b) of thin-film samples based on ferromagnetic alloy Ni80Fe20 (permalloy) and noble metal Ag in a wide composition range and within the range of thickness 20-100 nm done. Thin films were obtained by the method of electron-beam co-evaporation technique at room temperature. Their composition was investigated using the method of X-ray spectrometry. The phase state was analyzed by the electron diffraction method. It was demonstrated that the crystal structure of thin films stays unchanged during the annealing process to 500 K. The size and concentration dependences of r and b values were obtained. The corresponding maximum and minimum at the concentration of Ag atoms of 50-60 at.% observed at the dependences r(cAg) and b(cAg). Size dependences r(d) and b(d) associated with the size effects in thin-film materials.

Author Biographies

I. M. Pazukha, Sumy State University

Ph.D (Physics and Mathematics), Associated Professor of the Electronics, General and Applied Physics Department

D. O. Shuliarenko, Sumy State University

Ph.D student

O. V. Pylypenko , Sumy State University

Ph.D (Physics and Mathematics), Senior Lecture of the Electronics, General and Applied Physics Department

L. V. Odnodvorets , Sumy State University

Dr.Sc (Physics and Mathematics), Professor of the Electronics, General and Applied Physics Department

References

Ku Hoon Chung, Si Nyeon Kim, Sang Ho Lim, Thin Solid Films 650, 44 (2018) (https://doi.org/10.1016/j.tsf.2018.01.062).

A. Fert, F. N. Van Dau, Comptes Rendus Physique 20(7-8), 817 (2019) (https://doi.org/10.1016/j.crhy.2019.05.020)

I. M. Pazukha, Y. O. Shkurdoda, A. M. Chornous, L. V. Dekhtyaruk, International Journal of Modern Physics B 33, 1950113 (2019) (https://doi.org/10.1142/S0217979219501133)

L. V. Odnodvorets, I. Yu. Protsenko, Yu. M. Shabelnyk, M. O. Shumakova, O. P. Tkach, Journal of Nano- and Electronic Physics 8(3), 03034 (2016) (https://doi.org/10.21272/jnep.8(3).03034).

S. Kumaraguru, R. Pavulraj, J. Vijayakumar, S. Mohan, S. Kumaraguru, R. Pavulraj, J. Vijayakumar, S. Mohan 693, 1143 (2017) (https://doi.org/10.1016/j.jallcom.2016.10.027).

Qian Liu, Shaolong Jiang, Jiao Teng, Journal of Magnetism and Magnetic Materials 454, 264 (2018) (https://doi.org/10.1016/j.jmmm.2018.01.098).

Umesh P. Borole, Sasikala Subramaniam, Ishan R. Kulkarni, P. Saravanan, Harish C. Barshilia, P. Chowdhury, Sensors and Actuators A: Physical 280, 125 (2018) (https://doi.org/10.1016/j.sna.2018.07.022).

Arnab Roy, P. Sampathkumar, P. S. Anil Kumar, Measurement 156, 107590 (2020) (https://doi.org/10.1016/j.measurement.2020.107590).

I. M. Pazukha, D. O. Shuliarenko, O. V. Pylypenko, L. V. Odnodvorets, Journal of Magnetism and Magnetic Materials 485, 89 (2019) (https://doi.org/10.1016/j.jmmm.2019.04.079).

Yuan-Tsung Chen, Jiun-Yi Tseng, S. H. Lin, T. S. Sheu, Journal of Magnetism and Magnetic Materials 360, 87 (2014) (http://dx.doi.org/10.1016/j.jmmm.2014.02.005)

Guowen Ding, César Clavero, Daniel Schweigert, Minh Le, AIP Advances 5, 117234 (2015) (http://dx.doi.org/10.1063/1.4936637).

H. Y. Wan, X.M.Luo, X. Li, W. Liu, G. P. Zhang, Materials Science and Engineering A 676, 421 (2016) (http://dx.doi.org/10.1016/j.msea.2016.09.010).

Gesche Nahrwold, Jan M. Scholtyssek, Sandra Motl-Ziegler, Ole Albrecht, Ulrich Merkt, Guido Meier, Journal of Applied Physics 108, 013907 (2010) (https://doi.org/10.1063/1.3431384)

C.R.Tellier, A.J.Tosser, Size effects in thin films (Elsivier, 1982) (https://doi.org/10.1016/B978-0-444-42106-7.50005-X).

Downloads

Published

2020-06-15

How to Cite

Pazukha, I. M., Shuliarenko, D. O. ., Pylypenko , O. V., Оvrutskyi M. S., & Odnodvorets , L. V. (2020). Concentration and Size Effects in Electrophysical Properties of Thin Films Based on Permalloy and Silver. Physics and Chemistry of Solid State, 21(2), 238–242. https://doi.org/10.15330/pcss.21.2.238-242

Issue

Section

Scientific articles