The Thickness Dependence of Thermoelectric Parameters of thin Films Based on Compounds LAST
DOI:
https://doi.org/10.15330/pcss.17.3.368-371Keywords:
size effect, thin film, lead telluride, thermoelectric propertiesAbstract
The thermoelectric properties of thin films based on compounds PbSnAgTe, obtained by condensation of vapor on the high vacuum on mica substrate are researched. Based on a two-layer model Petrits are founded electrical parameters of surface layers. It is shown that condensates thickness d < 500 nm are characterized by improved thermoelectric properties.
References
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[2] V.M. Shperun, D.M. Freyik, R.I. Zapukhlyak, Termoelektryka telurydu svyntsyu ta yoho analohiv (Play, Ivano-Frankivs'k, 2000).
[3] U.P. Khairnar, S.S. Behere, and P.H. Pawar, Journal of Chemical, Biological and Physical Sciences 2(3), 1529 (2012).
[4] H. Wang et al., Appl. Phys. Lett. 88, 092104 (2006).
[5] R.L. Petritz. Phis. Rev. (110), 1254 (1958).
[6] M.A. Lop"yanko, S.I. Mudryy, S.V. Optanasyuk, T.O. Semko, T.S. Lyuba, H.D. Mateyik, I.V. Horichok, Ya.S. Yavors'kyy, Physics and Chemistry of Solid State 17(2), 193 (2016).
[7] M.A. Ruvins'kyy, O.B. Kostyuk, B.S. Dzundza, Journal of nano- i electronic physics 8(2), 02051 (2016).
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Published
2016-09-15
How to Cite
Dzundza, B., Kostyuk, O. ., & Makovyshyn, V. (2016). The Thickness Dependence of Thermoelectric Parameters of thin Films Based on Compounds LAST. Physics and Chemistry of Solid State, 17(3), 368–371. https://doi.org/10.15330/pcss.17.3.368-371
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Scientific articles