Investigation of The Effect of Annealing on Resistivity in Aluminum-based Amorphous Alloys

S. Kerli; Ü. Alver; M. Gögebakan

doi:10.15330/pcss.20.4.391-395

Authors

S. Kerli Energy System Engineering Department, Kahramanmaras İstiklal University
Ü. Alver Department of Metallurgical and Materials Engineering, Karadeniz Technical University
M. Gögebakan Department of Physics, Faculty of Science and Letter, Kahramanmaras Sutcu Imam University

DOI:

https://doi.org/10.15330/pcss.20.4.391-395

Keywords:

amorphous alloy, crystallization, electrical resistivity

Abstract

In this study, electrical properties of Al-Y-Ni alloys produced by melt-spinning method were investigated. Before annealing, XRD analyzes were performed and the samples were found to be amorphous. Exothermic peaks were observed in DSC measurements and crystallization stages of the alloys were determined. Al₈₅Y₁₁Ni₄, Al₈₅Y₁₀Ni₅ and Al₈₅Y₅Ni₁₀ samples were annealed at some temperature and their electrical resistivity was measured by four-point method. The large decrease in resistivity was observed during crystallization between 200 - 400 ˚C. These results were consistent with XRD and DSC measurements.

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