Analysis and research of methods of linearization of the transfer function of precision semiconductor temperature sensors

O. V. Boyko; Z. Y. Hotra

doi:10.15330/pcss.21.4.737-742

Authors

O. V. Boyko Danylo Halytsky Lviv National Medical University
Z. Y. Hotra Lviv Polytechnic National University

DOI:

https://doi.org/10.15330/pcss.21.4.737-742

Keywords:

transistor, temperanure sensor, linearisation

Abstract

The analysis of the nonlinearity of the transfer function of primary temperature transducers based on transistor structures has been performed. It’s shown that the quadratic component of the transfer function creates a significant nonlinearity error up to 0,2-0,6°C. We have developed methods of linearization based on both the formation of compensatory measuring current and change of the conversion factor of the output scaling amplifier at certain ranges of temperature measurement, which ensure their use in precision temperature measuring devices. The measurement error does not exceed 0.01°C in the range of 30-100°C.

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