Structure and optical characteristics of mercury-modified Se100-xAsx  amorphous films

V.M. Rubish; M.M. Pop; R.P. Pisak; M.O. Durkot; A.M. Solomon; V.V. Rubish; Yu.I. Tyagur; O.M. Mykaylo; D.I. Kaynts; R.O. Dzumedzey; V.V. Boryk; G.D. Mateik

doi:10.15330/pcss.25.3.471-477

Authors

V.M. Rubish Institute for Information Recording, NAS of Ukraine, Uzhgorod, Ukraine; Uzhgorod National University, Uzhgorod, Ukraine
M.M. Pop Institute for Information Recording, NAS of Ukraine, Uzhgorod, Ukraine; Uzhgorod National University, Uzhgorod, Ukraine
R.P. Pisak Institute for Information Recording, NAS of Ukraine, Uzhgorod, Ukraine
M.O. Durkot Institute for Information Recording, NAS of Ukraine, Uzhgorod, Ukraine
A.M. Solomon Institute of Electron Physics, NAS of Ukraine, Uzhgorod, Ukraine
V.V. Rubish Institute of Electron Physics, NAS of Ukraine, Uzhgorod, Ukraine
Yu.I. Tyagur Uzhgorod National University, Uzhgorod, Ukraine
O.M. Mykaylo Uzhgorod National University, Uzhgorod, Ukraine
D.I. Kaynts Uzhgorod National University, Uzhgorod, Ukraine
R.O. Dzumedzey Vasyl Stefanyk Precarpathian National University, Ivano-Frankivsk, Ukraine
V.V. Boryk Vasyl Stefanyk Precarpathian National University, Ivano-Frankivsk, Ukraine
G.D. Mateik Ivano-Frankivsk national technical university of oil and gas, Ivano-Frankivsk, Ukraine

DOI:

https://doi.org/10.15330/pcss.25.3.471-477

Keywords:

chalcogenide amorphous films, X-ray diffractometry, structure, transmission spectra, dispersion of the refraction index

Abstract

The structure and optical characteristics (transmission spectra and dispersion of the refraction index) of nominally pure and mercury-modified amorphous Se_100-xAs_x films (x = 0, 3, 5, 7, 9) were studied. It was ascertained that nominally pure films are X-ray amorphous. Exposure of the films in mercury vapor leads to the formation of HgSe crystalline inclusions in their near-surface layers. The width of the pseudo-forbidden gap E_g and the refraction indices n₂, n₂' and n₃ of both nominally pure (n₂) and those exposed to mercury vapor (n₂' and n₃) films were determined. Significant changes in the n₂' and n₃ values of amorphous films are caused by structural transformations that occur in them during modification.

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